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| Management number | 233379371 | Release Date | 2026/06/27 | List Price | US$44.24 | Model Number | 233379371 | ||
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Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. Read more
| ASIN | B00K83P3EM |
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| XRay | Not Enabled |
| ISBN13 | 978-3319048642 |
| Edition | 2014th |
| Language | English |
| File size | 13.8 MB |
| Page Flip | Enabled |
| Publisher | Springer |
| Word Wise | Enabled |
| Print length | 630 pages |
| Accessibility | Learn more |
| Screen Reader | Supported |
| Part of series | Springer Series in Surface Sciences |
| Publication date | May 8, 2014 |
| Enhanced typesetting | Enabled |
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